Ames Engineering AccuTexture 100 Enables IDOT/Purdue University Chip Seal QA Study
We’re proud to report that Indiana DOT and Purdue University researchers have used the Ames AccuTexture 100 sensors in a new study! They set out to develop a recommended improvement on their QA procedures using the Mean Profile Depth (MPD) Macrotexture measurement. Currently, the procedure is based on a visual inspection which is dependent on highly experienced and trained inspectors, is subjective, and is dangerous to complete in traffic. This study contends that MPD is a useful metric which correlates well to the findings of the visual inspection. Measuring MPD with the Ames AccuTexture 100 is much quicker than the visual inspection, so testing can be more widespread and completed in a much more timely manner. The study recommends testing should be done either at the one month and the twelve month points, or a single inspection after the first snow season in order to ensure longevity of the chip seal surface.
Read the study here:
2018 IDOT/Purdue University JTRP Chip Seal Quality Assurance Study
Zhao, G., Li, S., Jiang, Y., & Lee, J. (2018). Quality assurance procedures for chip seal operations using macrotexture metrics (Joint Transportation Research Program Publication No. FHWA/IN/JTRP2018/12). West Lafayette, IN: Purdue University. https://doi.org/10.5703/1288284316779